The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.
Mathematical Results In Quantum Mechanics : Proceedings Of A Conference On Qmath-8 Mathematical Results In Quantum Mechanics, December 10-14, 2001, Universidad Nacional Autonoma De Mexico, Taxco, Mexico
This book contains contributions presented at the conference, ``QMath-8: Mathematical Results in Quantum Mechanics'', held at Universidad Nacional Autonoma de Mexico in December 2001. The articles cover a wide range of mathematical problems and focus on various aspects of quantum mechanics, quantum field theory, and nuclear physics. Topics vary from spectral properties of the Schrodinger equation of various quantum systems to the analysis of quantum computation algorithms. The book is suitable for graduate students and research mathematicians interested in the mathematical aspects of quantum mechanics.
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